Στοιχεία MARC
000 -LEADER |
fixed length control field |
01372nom a2200373 u 4500 |
001 - CONTROL NUMBER |
control field |
10093640 |
003 - CONTROL NUMBER IDENTIFIER |
control field |
upatras |
005 - DATE AND TIME OF LATEST TRANSACTION |
control field |
20210422092523.0 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
fixed length control field |
110802s2010 eng |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
International Standard Book Number |
9783642024177 |
040 ## - CATALOGING SOURCE |
Original cataloging agency |
GR-PaULI |
Transcribing agency |
GR-PaULI |
041 0# - LANGUAGE CODE |
Language code of text/sound track or separate title |
eng |
100 1# - MAIN ENTRY--PERSONAL NAME |
Personal name |
Breitenstein, Otwin |
9 (RLIN) |
99998 |
245 10 - TITLE STATEMENT |
Title |
Lock-in Thermography |
Medium |
[electronic resource] |
Remainder of title |
Basics and Use for Evaluating Electronic Devices and Materials |
Statement of responsibility, etc. |
by Otwin Breitenstein, Wilhelm Warta, Martin Langenkamp |
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) |
Place of publication, distribution, etc. |
Berlin, Heidelberg |
Name of publisher, distributor, etc. |
Springer-Verlag Berlin Heidelberg |
Date of publication, distribution, etc. |
2010 |
300 ## - PHYSICAL DESCRIPTION |
Other physical details |
v.: digital |
490 0# - SERIES STATEMENT |
Series statement |
Springer Series in Advanced Microelectronics |
Volume/sequential designation |
10 |
International Standard Serial Number |
1437-0387 |
650 #4 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Physics |
9 (RLIN) |
20895 |
650 #4 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Engineering |
9 (RLIN) |
17712 |
650 #4 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Materials |
9 (RLIN) |
13218 |
650 #4 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Surfaces (Physics) |
9 (RLIN) |
64420 |
650 #4 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Physics |
9 (RLIN) |
20895 |
650 #4 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Οπτική |
9 (RLIN) |
353 |
650 #4 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Characterization and Evaluation of Materials |
9 (RLIN) |
64421 |
650 #4 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Engineering, general |
9 (RLIN) |
64337 |
650 #4 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Δομική μηχανική |
9 (RLIN) |
64858 |
700 1# - ADDED ENTRY--PERSONAL NAME |
Personal name |
Warta, Wilhelm |
9 (RLIN) |
99999 |
700 1# - ADDED ENTRY--PERSONAL NAME |
Personal name |
Langenkamp, Martin |
9 (RLIN) |
100000 |
710 2# - ADDED ENTRY--CORPORATE NAME |
Corporate name or jurisdiction name as entry element |
SpringerLink (Online service) |
9 (RLIN) |
68735 |
760 1# - MAIN SERIES ENTRY |
Main entry heading |
Springer Series in Advanced Microelectronics |
Related parts |
10 |
International Standard Serial Number |
1437-0387 |
856 40 - ELECTRONIC LOCATION AND ACCESS |
Uniform Resource Identifier |
<a href="http://dx.doi.org/10.1007/978-3-642-02417-7">http://dx.doi.org/10.1007/978-3-642-02417-7</a> |
942 ## - ADDED ENTRY ELEMENTS (KOHA) |
Source of classification or shelving scheme |
Dewey Decimal Classification |