Lock-in Thermography
Breitenstein, Otwin
Lock-in Thermography Basics and Use for Evaluating Electronic Devices and Materials [electronic resource] by Otwin Breitenstein, Wilhelm Warta, Martin Langenkamp - Berlin, Heidelberg Springer-Verlag Berlin Heidelberg 2010 - v.: digital - Springer Series in Advanced Microelectronics 10 1437-0387 .
9783642024177
Physics
Engineering
Materials
Surfaces (Physics)
Physics
Οπτική
Characterization and Evaluation of Materials
Engineering, general
Δομική μηχανική
Lock-in Thermography Basics and Use for Evaluating Electronic Devices and Materials [electronic resource] by Otwin Breitenstein, Wilhelm Warta, Martin Langenkamp - Berlin, Heidelberg Springer-Verlag Berlin Heidelberg 2010 - v.: digital - Springer Series in Advanced Microelectronics 10 1437-0387 .
9783642024177
Physics
Engineering
Materials
Surfaces (Physics)
Physics
Οπτική
Characterization and Evaluation of Materials
Engineering, general
Δομική μηχανική
