Στοιχεία MARC
000 -LEADER |
fixed length control field |
01011nom a2200301 u 4500 |
001 - CONTROL NUMBER |
control field |
10070951 |
003 - CONTROL NUMBER IDENTIFIER |
control field |
upatras |
005 - DATE AND TIME OF LATEST TRANSACTION |
control field |
20210117201632.0 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
fixed length control field |
090513s2005 eng |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
International Standard Book Number |
9780387263519 |
040 ## - CATALOGING SOURCE |
Original cataloging agency |
GR-PaULI |
Transcribing agency |
GR-PaULI |
041 0# - LANGUAGE CODE |
Language code of text/sound track or separate title |
eng |
100 1# - MAIN ENTRY--PERSONAL NAME |
Personal name |
Huisman, Leendert M. |
9 (RLIN) |
67742 |
245 10 - TITLE STATEMENT |
Title |
Data Mining and Diagnosing IC Fails |
Medium |
[electronic resource] |
Statement of responsibility, etc. |
by Leendert M. Huisman |
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) |
Place of publication, distribution, etc. |
Boston, MA |
Name of publisher, distributor, etc. |
Springer Science+Business Media, Inc. |
Date of publication, distribution, etc. |
2005 |
300 ## - PHYSICAL DESCRIPTION |
Other physical details |
v.: digital |
490 0# - SERIES STATEMENT |
Series statement |
Frontiers in Electronic Testing |
Volume/sequential designation |
31 |
International Standard Serial Number |
0929-1296 |
650 #4 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Engineering |
9 (RLIN) |
17712 |
650 #4 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Electronics |
9 (RLIN) |
15695 |
650 #4 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Systems engineering |
9 (RLIN) |
64844 |
650 #4 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Engineering |
9 (RLIN) |
17712 |
650 #4 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Electronics and Microelectronics, Instrumentation |
9 (RLIN) |
64430 |
650 #4 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Circuits and Systems |
9 (RLIN) |
24301 |
760 1# - MAIN SERIES ENTRY |
Main entry heading |
Frontiers in Electronic Testing |
Related parts |
31 |
International Standard Serial Number |
0929-1296 |
856 40 - ELECTRONIC LOCATION AND ACCESS |
Uniform Resource Identifier |
<a href="http://dx.doi.org/10.1007/b137446">http://dx.doi.org/10.1007/b137446</a> |
942 ## - ADDED ENTRY ELEMENTS (KOHA) |
Source of classification or shelving scheme |
Dewey Decimal Classification |