Data Mining and Diagnosing IC Fails
Huisman, Leendert M.
Data Mining and Diagnosing IC Fails [electronic resource] by Leendert M. Huisman - Boston, MA Springer Science+Business Media, Inc. 2005 - v.: digital - Frontiers in Electronic Testing 31 0929-1296 .
9780387263519
Engineering
Electronics
Systems engineering
Engineering
Electronics and Microelectronics, Instrumentation
Circuits and Systems
Data Mining and Diagnosing IC Fails [electronic resource] by Leendert M. Huisman - Boston, MA Springer Science+Business Media, Inc. 2005 - v.: digital - Frontiers in Electronic Testing 31 0929-1296 .
9780387263519
Engineering
Electronics
Systems engineering
Engineering
Electronics and Microelectronics, Instrumentation
Circuits and Systems
