Quantum metrology with photoelectrons. (Αριθ. εγγραφής 139898)
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| fixed length control field | 04404nam a2200421 i 4500 |
| 001 - CONTROL NUMBER | |
| control field | 9781681746883 |
| 003 - CONTROL NUMBER IDENTIFIER | |
| control field | IOP |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20190304183941.0 |
| 006 - FIXED-LENGTH DATA ELEMENTS--ADDITIONAL MATERIAL CHARACTERISTICS | |
| fixed length control field | m eo d |
| 007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION | |
| fixed length control field | cr cn |||m|||a |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 180504s2018 caua ob 000 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 9781681746883 |
| Qualifying information | ebook |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 9781681746906 |
| Qualifying information | mobi |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| Canceled/invalid ISBN | 9781681746890 |
| Qualifying information | |
| 024 7# - OTHER STANDARD IDENTIFIER | |
| Standard number or code | 10.1088/978-1-6817-4688-3 |
| Source of number or code | doi |
| 035 ## - SYSTEM CONTROL NUMBER | |
| System control number | (CaBNVSL)thg00975906 |
| 035 ## - SYSTEM CONTROL NUMBER | |
| System control number | (OCoLC)1034808728 |
| 040 ## - CATALOGING SOURCE | |
| Original cataloging agency | CaBNVSL |
| Language of cataloging | gre |
| Description conventions | AACR2 |
| Transcribing agency | GR-PaULI |
| Modifying agency | GR-PaULI |
| 082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 389.1 |
| Edition number | 23 |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Hockett, Paul |
| Relator term | συγγραφέας. |
| 9 (RLIN) | 174434 |
| 245 10 - TITLE STATEMENT | |
| Title | Quantum metrology with photoelectrons. |
| Number of part/section of a work | Volume 2, |
| Name of part/section of a work | Applications and advances / |
| Statement of responsibility, etc. | Paul Hockett. |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Place of publication, distribution, etc. | San Rafael [Καλιφόρνια] : |
| Name of publisher, distributor, etc. | Morgan & Claypool Publishers, |
| Date of publication, distribution, etc. | c2018. |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | 1 ηλεκτρονική πηγή (ποικίλες σελιδαριθμήσεις) : |
| Other physical details | έγχρ. εικ.. |
| 490 1# - SERIES STATEMENT | |
| Series statement | IOP concise physics, |
| International Standard Serial Number | 2053-2571 |
| 504 ## - BIBLIOGRAPHY, ETC. NOTE | |
| Bibliography, etc | Περιλαμβάνει βιβλιογραφικές παραπομπές. |
| 505 0# - FORMATTED CONTENTS NOTE | |
| Formatted contents note | part III. Developments, methodologies and measurements -- 8. Developing quantum metrology with photoelectrons -- 8.1. Historical development : complete photoionization experiments -- 8.2. Experimental and analysis methodologies |
| 505 8# - FORMATTED CONTENTS NOTE | |
| Formatted contents note | 9. State-resolved frequency-domain measurements -- 9.1. Rotationally-resolved photoelectron imaging -- 9.2. Bootstrapping complexity : from atomic to molecular scattering -- 9.3. Photoelectron angular interferograms and determination of the dipole matrix elements -- 9.4. Uniqueness : mapping the [chi]2 hyperspace and verification -- 9.5. Pump-probe polarization geometry dependence and tomographic imaging |
| 505 8# - FORMATTED CONTENTS NOTE | |
| Formatted contents note | 10. Time-domain measurements with intra-pulse dynamics -- 10.1. Photoelectron imaging measurements from potassium -- 10.2. Photoelectron image simulation and parameter reconstruction -- 10.3. Photoelectron angular interferograms and determination of the dipole matrix elements -- 10.4. Mapping [chi]2 : fit statistics and sensitivity -- 10.5. Comparison with tomographic data |
| 505 8# - FORMATTED CONTENTS NOTE | |
| Formatted contents note | 11. Time-domain measurements with rotational wavepackets : bootstrapping protocol -- 11.1. Test case : butadiene model -- 11.2. Nitrogen aligned-frame photoelectron imaging -- 11.3. Bootstrapping protocol -- 11.4. Photoionization matrix elements -- 11.5. Molecular frame reconstructions -- 11.6. Bootstrap protocol summary and outlook |
| 505 8# - FORMATTED CONTENTS NOTE | |
| Formatted contents note | part IV. Generalisations and future directions -- 12. Advances -- 12.1. Information content revisited -- 12.2. Multiplexing and control -- 12.3. Generalised bootstrapping |
| 505 8# - FORMATTED CONTENTS NOTE | |
| Formatted contents note | 13. Future directions and outlook -- 13.1. Bootstrapping to quantitative quantum dynamics -- 13.2. Further directions for quantum metrologies based on photoelectron interferograms -- 13.3. Summary and outlook. |
| 520 3# - SUMMARY, ETC. | |
| Summary, etc. | Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 2: Applications and advances discusses the fundamental concepts along with recent and emerging applications. Volume 2 explores the applications and development of quantum metrology schemes based on photoelectron measurements. The author begins with a brief historical background on 'complete' photoionization experiments, followed by the details of state reconstruction methodologies from experimental measurements. Three specific applications of quantum metrology schemes are discussed in detail. In addition, the book provides advances, future directions, and an outlook including (ongoing) work to generalise these schemes and extend them to dynamical many-body systems. Volume 2 will be of interest to readers wishing to see the (sometimes messy) details of state reconstruction from photoelectron measurements as well as explore the future prospects for this class of metrology. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name as entry element | Μετρολογία |
| 9 (RLIN) | 132365 |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name as entry element | Θεωρία κβαντικής μέτρησης |
| 9 (RLIN) | 174435 |
| 830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE | |
| Uniform title | IOP concise physics. |
| 856 40 - ELECTRONIC LOCATION AND ACCESS | |
| Uniform Resource Identifier | <a href="http://iopscience.iop.org/book/978-1-6817-4688-3">http://iopscience.iop.org/book/978-1-6817-4688-3</a> |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Source of classification or shelving scheme | Dewey Decimal Classification |
| Koha item type | Electronic Resource |
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