Quantum metrology with photoelectrons.

Hockett, Paul

Quantum metrology with photoelectrons. Volume 2, Applications and advances / Paul Hockett. - San Rafael [Καλιφόρνια] : Morgan & Claypool Publishers, c2018. - 1 ηλεκτρονική πηγή (ποικίλες σελιδαριθμήσεις) : έγχρ. εικ.. - IOP concise physics, 2053-2571 . - IOP concise physics. .

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part III. Developments, methodologies and measurements -- 8. Developing quantum metrology with photoelectrons -- 8.1. Historical development : complete photoionization experiments -- 8.2. Experimental and analysis methodologies 9. State-resolved frequency-domain measurements -- 9.1. Rotationally-resolved photoelectron imaging -- 9.2. Bootstrapping complexity : from atomic to molecular scattering -- 9.3. Photoelectron angular interferograms and determination of the dipole matrix elements -- 9.4. Uniqueness : mapping the [chi]2 hyperspace and verification -- 9.5. Pump-probe polarization geometry dependence and tomographic imaging 10. Time-domain measurements with intra-pulse dynamics -- 10.1. Photoelectron imaging measurements from potassium -- 10.2. Photoelectron image simulation and parameter reconstruction -- 10.3. Photoelectron angular interferograms and determination of the dipole matrix elements -- 10.4. Mapping [chi]2 : fit statistics and sensitivity -- 10.5. Comparison with tomographic data 11. Time-domain measurements with rotational wavepackets : bootstrapping protocol -- 11.1. Test case : butadiene model -- 11.2. Nitrogen aligned-frame photoelectron imaging -- 11.3. Bootstrapping protocol -- 11.4. Photoionization matrix elements -- 11.5. Molecular frame reconstructions -- 11.6. Bootstrap protocol summary and outlook part IV. Generalisations and future directions -- 12. Advances -- 12.1. Information content revisited -- 12.2. Multiplexing and control -- 12.3. Generalised bootstrapping 13. Future directions and outlook -- 13.1. Bootstrapping to quantitative quantum dynamics -- 13.2. Further directions for quantum metrologies based on photoelectron interferograms -- 13.3. Summary and outlook.

Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 2: Applications and advances discusses the fundamental concepts along with recent and emerging applications. Volume 2 explores the applications and development of quantum metrology schemes based on photoelectron measurements. The author begins with a brief historical background on 'complete' photoionization experiments, followed by the details of state reconstruction methodologies from experimental measurements. Three specific applications of quantum metrology schemes are discussed in detail. In addition, the book provides advances, future directions, and an outlook including (ongoing) work to generalise these schemes and extend them to dynamical many-body systems. Volume 2 will be of interest to readers wishing to see the (sometimes messy) details of state reconstruction from photoelectron measurements as well as explore the future prospects for this class of metrology.

9781681746883 9781681746906

10.1088/978-1-6817-4688-3 doi


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