Electron microscopy and analysis 1999 : (Αριθ. εγγραφής 138253)
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| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20190114101342.0 |
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| 007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION | |
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| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 010219s1999 enka ob 101 0 eng d |
| 010 ## - LIBRARY OF CONGRESS CONTROL NUMBER | |
| Canceled/invalid LC control number | 99058788 |
| 040 ## - CATALOGING SOURCE | |
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| Language of cataloging | eng |
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| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 0585347042 |
| Qualifying information | (electronic bk.) |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 9780585347042 |
| Qualifying information | (electronic bk.) |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| Canceled/invalid ISBN | 0750305770 |
| 035 ## - | |
| -- | (OCoLC)47008872 |
| -- | (OCoLC)533201202 |
| -- | (OCoLC)961650942 |
| -- | (OCoLC)962671633 |
| -- | (OCoLC)970723741 |
| -- | (OCoLC)984870227 |
| -- | (OCoLC)1007403081 |
| 050 #4 - | |
| -- | QH212.E4 |
| -- | E3798 1999eb |
| 072 #7 - | |
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| -- | bisacsh |
| 082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 502/.8/25 |
| Edition number | 21 |
| 049 ## - | |
| -- | MAIN |
| 245 00 - TITLE STATEMENT | |
| Title | Electron microscopy and analysis 1999 : |
| Remainder of title | proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference, University of Sheffield, 24-27 August 1999 / |
| Statement of responsibility, etc. | edited by C.J. Kiely. |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Place of publication, distribution, etc. | Bristol ; |
| -- | Philadelphia : |
| Name of publisher, distributor, etc. | Institute of Physics Pub., |
| Date of publication, distribution, etc. | �1999. |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | 1 online resource (xvii, 632 pages) : |
| Other physical details | illustrations. |
| 336 ## - | |
| -- | text |
| -- | txt |
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| 338 ## - | |
| -- | online resource |
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| 490 1# - SERIES STATEMENT | |
| Series statement | Institute of Physics conference series ; |
| Volume/sequential designation | no. 161 |
| 504 ## - BIBLIOGRAPHY, ETC. NOTE | |
| Bibliography, etc | Includes bibliographical references and indexes. |
| 505 00 - FORMATTED CONTENTS NOTE | |
| Miscellaneous information | Section 1 |
| Title | Plenary lectures -- |
| Miscellaneous information | Section 2 |
| Title | Interfaces and surfaces -- |
| Miscellaneous information | Section 3 |
| Title | Scanning electron microscopy -- |
| Miscellaneous information | Section 4 |
| Title | Electron crystallography -- |
| Miscellaneous information | Section 5 |
| Title | Analytical electron microscopy -- |
| Miscellaneous information | Section 6 |
| Title | High resolution electron microscopy -- |
| Miscellaneous information | Section 7 |
| Title | Advanced scanning probe techniques -- |
| Miscellaneous information | Section 8 |
| Title | Ceramics/carbon/composites -- |
| Miscellaneous information | Section 9 |
| Title | Metals/intermetallics -- |
| Miscellaneous information | Section 10 |
| Title | Catalysts/sensors/environmental materials -- |
| Miscellaneous information | Section 11 |
| Title | Semiconductors/superconductors. |
| 588 0# - | |
| -- | Print version record. |
| 590 ## - | |
| -- | OCLC |
| -- | WorldCat Holdings |
| 590 ## - | |
| -- | eBooks on EBSCOhost |
| -- | All EBSCO eBooks |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name as entry element | Electron microscopy |
| Form subdivision | Congresses. |
| 650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name as entry element | SCIENCE |
| General subdivision | Electron Microscopes & Microscopy. |
| Source of heading or term | bisacsh |
| 650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name as entry element | Electron microscopy. |
| Source of heading or term | fast |
| -- | (OCoLC)fst00906682 |
| 655 #4 - INDEX TERM--GENRE/FORM | |
| Genre/form data or focus term | Electronic books. |
| 655 #7 - INDEX TERM--GENRE/FORM | |
| Genre/form data or focus term | Conference papers and proceedings. |
| Source of term | fast |
| -- | (OCoLC)fst01423772 |
| 700 1# - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Kiely, C. J. |
| 710 2# - ADDED ENTRY--CORPORATE NAME | |
| Corporate name or jurisdiction name as entry element | Institute of Physics (Great Britain). |
| Subordinate unit | Electron Microscopy and Analysis Group. |
| 776 08 - ADDITIONAL PHYSICAL FORM ENTRY | |
| Relationship information | Print version: |
| Title | Electron microscopy and analysis 1999. |
| Place, publisher, and date of publication | Bristol ; Philadelphia : Institute of Physics Pub., �1999 |
| International Standard Book Number | 0750305770 |
| Record control number | <a href="(DLC) 99058788">(DLC) 99058788</a> |
| -- | <a href="(OCoLC)42888129">(OCoLC)42888129</a> |
| 830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE | |
| Uniform title | Institute of Physics conference series ; |
| Volume number/sequential designation | no. 161. |
| 856 40 - ELECTRONIC LOCATION AND ACCESS | |
| Uniform Resource Identifier | http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=27512 |
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