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Electron microscopy and analysis 1999 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference, University of Sheffield, 24-27 August 1999 / edited by C.J. Kiely. - Bristol ; Philadelphia : Institute of Physics Pub., �1999. - 1 online resource (xvii, 632 pages) : illustrations. - Institute of Physics conference series ; no. 161 . - Institute of Physics conference series ; no. 161. .

Includes bibliographical references and indexes.

Plenary lectures -- Interfaces and surfaces -- Scanning electron microscopy -- Electron crystallography -- Analytical electron microscopy -- High resolution electron microscopy -- Advanced scanning probe techniques -- Ceramics/carbon/composites -- Metals/intermetallics -- Catalysts/sensors/environmental materials -- Semiconductors/superconductors. Section 1 Section 2 Section 3 Section 4 Section 5 Section 6 Section 7 Section 8 Section 9 Section 10 Section 11

ISBN: 0585347042 9780585347042

LCCN:

Subjects--Topical Terms:
Electron microscopy--Congresses.
SCIENCE--Electron Microscopes & Microscopy.
Electron microscopy.

Index Terms--Genre/Form:
Electronic books.
Conference papers and proceedings.

LC Class. No.: QH212.E4 / E3798 1999eb

Dewey Class. No.: 502/.8/25