Κανονική προβολή Προβολή MARC Προβολή ISBD

Digital circuit testing and testability Parag K. Lala, auth. - San Diego Academic Press 1997 - xii,199p.:fig.

ISBN: 0 12 434330 9

Subjects--Topical Terms:
ΕΠΕΑΕΚ
INTEGRATED CIRCUITS
VLSI
DIGITAL INTEGRATED CIRCUITS

Dewey Class. No.: 621.395