Defect Oriented Testing for CMOS Analog and Digital Circuits
Defect Oriented Testing for CMOS Analog and Digital Circuits
- Boston Kluwer Academic Publishers c1998
- xiv,308p. fig.
- Frontiers in Electronic Testing / Vishwani D. Agrawal .
includes bibl. references
0 7923 8083 5
Αναλογικά ολοκληρωμένα κυκλώματα
CIRCUIT DESIGN
CMOS
DIGITAL CIRCUITS
ΕΠΕΑΕΚ
includes bibl. references
0 7923 8083 5
Αναλογικά ολοκληρωμένα κυκλώματα
CIRCUIT DESIGN
CMOS
DIGITAL CIRCUITS
ΕΠΕΑΕΚ
