Κανονική προβολή Προβολή MARC Προβολή ISBD

Egerton, Ray F.

Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEM [electronic resource] by Ray F. Egerton - Boston, MA Springer Science+Business Media, Inc. 2005 - v.: digital

ISBN: 9780387260167

Subjects--Topical Terms:
Materials
Μικροσκόπια
Chemistry
Characterization and Evaluation Materials
Biological Microscopy