| 000 | 00809nam a2200253 u 4500 | ||
|---|---|---|---|
| 001 | 10105489 | ||
| 003 | upatras | ||
| 005 | 20210117204159.0 | ||
| 008 | 991223s1997 f eng | ||
| 020 | _a0 12 434330 9 | ||
| 040 |
_aΒιβλιοθήκη ΙΤΥ _cΒιβλιοθήκη ΙΤΥ |
||
| 040 |
_aXX-XxUND _cΒιβλιοθήκη ΙΤΥ |
||
| 082 | 1 | 4 |
_a621.395 _220th ed. |
| 245 | 1 | 0 |
_aDigital circuit testing and testability _cParag K. Lala, auth. |
| 260 |
_aSan Diego _bAcademic Press _c1997 |
||
| 300 | _axii,199p.:fig. | ||
| 650 | 4 |
_aΕΠΕΑΕΚ _9116438 |
|
| 650 | 4 |
_aINTEGRATED CIRCUITS _924300 |
|
| 650 | 4 |
_aVLSI _924366 |
|
| 650 | 4 |
_aDIGITAL INTEGRATED CIRCUITS _9124354 |
|
| 700 | 1 |
_aLala, Parag K. _9116564 |
|
| 942 | _2ddc | ||
| 999 |
_c90078 _d90078 |
||