| 000 | 00930cam a22002653u 4500 | ||
|---|---|---|---|
| 001 | 10105388 | ||
| 003 | upatras | ||
| 005 | 20210419083428.0 | ||
| 008 | 991022s eng | ||
| 020 | _a0 306 44360 0 | ||
| 040 |
_aΒιβλιοθήκη ΕΑΙΤΥ _cΒιβλιοθήκη ΕΑΙΤΥ |
||
| 041 | 0 | _aeng | |
| 245 | 1 | 0 | _aElectron beam testing technology |
| 260 |
_aNew York _bPlenum Press _cc1993 |
||
| 300 |
_axvi,462p. _bfig. |
||
| 490 | 0 | _aMicrodevices Physics and Fabrication Technologies / Ivor Brodie and Julius J. Muray | |
| 500 | _aβιβλιογραφια ανα κεφάλαιο ΕΠΕΑΕΚ/ΙΤΥ | ||
| 650 | 4 |
_aELECTRON BEAMS _9124427 |
|
| 650 | 4 |
_aΗμιαγωγοί _9722 |
|
| 650 | 4 |
_aΕΠΕΑΕΚ _9116438 |
|
| 700 | 1 |
_aThong, John _4edt _9124428 |
|
| 760 | 0 | _aMicrodevices Physics and Fabrication Technologies | |
| 942 | _2ddc | ||
| 999 |
_c89877 _d89877 |
||