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| 001 | 10102557 | ||
| 003 | upatras | ||
| 005 | 20210117203901.0 | ||
| 008 | 991022s eng | ||
| 040 |
_aΒιβλιοθήκη ΕΑΙΤΥ _cΒιβλιοθήκη ΕΑΙΤΥ |
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| 041 | 0 | _aeng | |
| 245 | 1 | 0 |
_aThe state of the Art:from device testing to reconfigurable systems. FTC/3 _bInternational symposium on Fault-Tolerant Computing Palo Alto, CA, June 20-23, 1973 |
| 260 |
_aNew York _bIEEE Computer Society Press _cc1973 |
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| 300 |
_av, 182p. _bfig. |
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| 500 | _aΠεριέχει βιβλιογραφικές αναφορές | ||
| 650 | 4 |
_aFAULT _xTOLERANT COMPUTING _9113283 |
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| 650 | 4 |
_aFTCS _9113284 |
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| 650 | 4 |
_aIEEE _924256 |
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| 650 | 4 |
_aPROCEEDINGS _924278 |
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| 710 | 2 |
_aIEEE Computer Society _4fnd _923536 |
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| 942 | _2ddc | ||
| 999 |
_c84345 _d84345 |
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