| 000 | 00942cam a22002653u 4500 | ||
|---|---|---|---|
| 001 | 10101922 | ||
| 003 | upatras | ||
| 005 | 20210117203822.0 | ||
| 008 | 991022s eng | ||
| 020 | _a0 89838 185 1 | ||
| 040 |
_aΒιβλιοθήκη ΕΑΙΤΥ _cΒιβλιοθήκη ΕΑΙΤΥ |
||
| 041 | 0 | _aeng | |
| 245 | 1 | 0 | _aAn artificial intelligence approach to test generation |
| 260 |
_aBoston _bKluwer Academic Publishers _cc1987 |
||
| 300 |
_ax,193p. _bfig. |
||
| 490 | 0 | _aKluwer International Series in Engineering and Computer Science | |
| 500 | _aΒιβλιογραφία : σσ. 189-193 | ||
| 650 | 4 |
_aINTEGRATED CIRCUITS _924300 |
|
| 650 | 4 |
_aVLSI _924366 |
|
| 650 | 4 |
_984642 _aΤεχνητή νοημοσύνη |
|
| 700 | 1 |
_aSingh, Narinder _4aut _9116157 |
|
| 760 | 0 | _aKluwer International Series in Engineering and Computer Science | |
| 942 | _2ddc | ||
| 999 |
_c83099 _d83099 |
||