| 000 | 01198nom a2200349 u 4500 | ||
|---|---|---|---|
| 001 | 10070939 | ||
| 003 | upatras | ||
| 005 | 20210117201632.0 | ||
| 008 | 090513s2005 eng | ||
| 020 | _a9780387256245 | ||
| 040 |
_aGR-PaULI _cGR-PaULI |
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| 041 | 0 | _aeng | |
| 100 | 1 |
_aLarsson, Erik _918777 |
|
| 245 | 1 | 0 |
_aIntroduction to Advanced System-on-Chip Test Design and Optimization _h[electronic resource] _cby Erik Larsson |
| 260 |
_aBoston, MA _bSpringer _c2005 |
||
| 300 | _bv.: digital | ||
| 490 | 0 |
_aFrontiers in Electronic Testing _v29 _x0929-1296 |
|
| 650 | 4 |
_aEngineering _917712 |
|
| 650 | 4 |
_aOptical materials _964444 |
|
| 650 | 4 |
_aComputer engineering _924296 |
|
| 650 | 4 |
_aElectronics _915695 |
|
| 650 | 4 |
_aEngineering design _964845 |
|
| 650 | 4 |
_aEngineering _917712 |
|
| 650 | 4 |
_aOptical and Electronic Materials _964446 |
|
| 650 | 4 |
_aElectronic and Computer Engineering _964855 |
|
| 650 | 4 |
_aElectronics and Microelectronics, Instrumentation _964430 |
|
| 650 | 4 |
_aEngineering Design _964846 |
|
| 760 | 1 |
_aFrontiers in Electronic Testing _g29 _x0929-1296 |
|
| 856 | 4 | 0 | _uhttp://dx.doi.org/10.1007/b135763 |
| 942 | _2ddc | ||
| 999 |
_c47184 _d47184 |
||