| 000 | 00848nam a2200253 u 4500 | ||
|---|---|---|---|
| 001 | 10020028 | ||
| 003 | upatras | ||
| 005 | 20160425002905.0 | ||
| 008 | 881025s1983 gre | ||
| 020 | _a3540115153 | ||
| 040 |
_aGR-PaULI _cGR-PaULI |
||
| 100 | 1 |
_aBourgoin, Jacques _94377 |
|
| 245 | 1 | 0 |
_aPoint defects in semiconductors II _bexperimental aspects _cΝικηφόρου Βρεττάκου |
| 260 |
_aBerlin Heidelberg _bSpringer - Verlag _c1983 |
||
| 300 |
_axvi, 295 p. _bfig. _c23 cm |
||
| 490 | 0 |
_aSpringer series in solid state sciences _v35 |
|
| 500 | _aWith a foreword by G. D. Watkins | ||
| 505 | 1 | _aIncludes references, subject index | |
| 650 | 4 |
_aΗμιαγωγοί _9722 |
|
| 700 | 1 |
_aLannoo, M. _9125721 |
|
| 760 | 1 |
_aSpringer series in solid-state sciences _g35 |
|
| 942 | _2ddc | ||
| 999 |
_c110458 _d110458 |
||