Fundamentals of Nanoscale Film Analysis [electronic resource] by Terry L. Alford, Leonard C. Feldman, James W. Mayer
Τύπος υλικού:![Κιτ](/opac-tmpl/lib/famfamfam/MX.png)
- 9780387292618
- Surfaces (Physics)
- Nanotechnology
- Particles (Nuclear physics)
- Condensed matter
- Electronics
- Chemistry
- Characterization and Evaluation of Materials
- Surfaces and Interfaces, Thin Films
- Nanotechnology
- Solid State Physics and Spectroscopy
- Condensed Matter
- Electronics and Microelectronics, Instrumentation
Τύπος τεκμηρίου | Τρέχουσα βιβλιοθήκη | Ταξιθετικός αριθμός | Κατάσταση | Ημερομηνία λήξης | Ραβδοκώδικας |
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ΒΚΠ - Πατρα | Διαθέσιμο |