Κανονική προβολή Προβολή MARC Προβολή ISBD

Hierarchical Modeling for VLSI Circuit Testing Debashis Bhattacharya, John P. Hayes authors - Boston Kluwer Academic Publishers 1990 - x,159p.:fig.

ISBN: 0 7923 9058 X

Subjects--Topical Terms:
ΕΠΕΑΕΚ
VLSI
INTEGRATED CIRCUITS
COMPUTER SIMULATION

Dewey Class. No.: 621.395