Testability concepts for digital ICs
Testability concepts for digital ICs The Macrotest approach
- Dordrecht Kluwer Academic Publishers c1995
- ix,212p. fig
bibl.references:pp.197-205
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bibl.references:pp.197-205
0 7923 9658 8
Έλεγχος
Δοκιμές
ΕΠΕΑΕΚ