Material characterization using ion beams /
Material characterization using ion beams /
edited by J.P. Thomas; A. Cachard.
- New York : Plenum Press, 1978.
- xviii, 517 σ. : εικ. ; 26 εκ.
- NATO ASI series : Series B: Physics 28. .
- NATO ASI series. Series B. Physics 28. .
0306357283
Ιόντα
530.416
0306357283
Ιόντα
530.416