Κανονική προβολή Προβολή MARC Προβολή ISBD

Eberhart, Jean Pierre

Structural and chemical analysis of materials X-ray, electron and neutron diffraction, X-ray, electron and ion spectrometry, electron microscopy J. P. Eberhart ; Translated by J. P. Eberhart; translated by J. P. Eberhart - Chichester John Wiley & Sons 1991 - xxx, 545 p. fig., tab. 24 cm.

Includes appendix, references and index

ISBN: 0471950149

Subjects--Topical Terms:
Επιστήμη των υλικών
Φυσική της στερεάς κατάστασης

Dewey Class. No.: 530.4